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New implementions of predictive alternate analog/RF test with augmented model redundancy.

, , , , , and . DATE, page 1-4. European Design and Automation Association, (2014)

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Smart selection of indirect parameters for DC-based alternate RF IC testing., , , , , , , and . VTS, page 19-24. IEEE Computer Society, (2012)Evaluation of indirect measurement selection strategies in the context of analog/RF alternate testing., , , , , and . LATW, page 1-6. IEEE, (2014)New implementions of predictive alternate analog/RF test with augmented model redundancy., , , , , and . DATE, page 1-4. European Design and Automation Association, (2014)Test configurations to enhance the testability of sequential circuits., , , and . Asian Test Symposium, page 160-168. IEEE Computer Society, (1995)Different experiments in test generation for XILINX FPGAs., and . ITC, page 854-862. IEEE Computer Society, (2000)A DFT Technique to Improve ATPG Efficiency for Sequential Circuits., , and . VLSI Design, page 51-54. IEEE Computer Society, (1993)TI-BIST: a temperature independent analog BIST for switched-capacitor filters., , , , , and . Asian Test Symposium, page 78-83. IEEE Computer Society, (2000)A Framework for Efficient Implementation of Analog/RF Alternate Test with Model Redundancy., , , , , and . ISVLSI, page 621-626. IEEE Computer Society, (2015)A Specific Test Methodology for Symmetric SRAM-Based FPGAs.. FPL, volume 1896 of Lecture Notes in Computer Science, page 300-311. Springer, (2000)Guest Editorial., , and . J. Electron. Test., 21 (3): 203 (2005)