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Improving the Test Quality for Scan-Based BIST Using a General Test Application Scheme.

, , and . DAC, page 748-753. ACM Press, (1999)

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A Simulation-Based Method for Generating Tests for Sequential Circuits., , and . IEEE Trans. Computers, 39 (12): 1456-1463 (1990)An Accurate Jitter Estimation Technique for Efficient High Speed I/O Testing., and . ATS, page 224-229. IEEE, (2007)PBIR: perception-based image retrieval-a system that can quickly capture subjective image query concepts., , , , , and . ACM Multimedia, page 611-614. ACM, (2001)Reliability Analysis for Flexible Electronics: Case Study of Integrated a-Si: H TFT Scan Driver., , , and . DAC, page 966-969. IEEE, (2007)SVM Binary Classifier Ensembles for Image Classification., , and . CIKM, page 395-402. ACM, (2001)Contest: A Concurrent Test Generator for Sequential Circuits., , and . DAC, page 84-89. ACM, (1988)On the Over-Specification Problem in Sequential ATPG Algorithms., and . DAC, page 16-21. IEEE Computer Society Press, (1992)A sequential circuit test generation using threshold-value simulation., , and . FTCS, page 24-29. IEEE Computer Society, (1988)A Hybrid Power Model for RTL Power Estimation., , , , and . ASP-DAC, page 551-556. IEEE, (1998)Pseudo-CMOS: A novel design style for flexible electronics., , , , , , and . DATE, page 154-159. IEEE Computer Society, (2010)