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Scan based speed-path debug for a microprocessor.

, , , , , , and . European Test Symposium, page 207-212. IEEE Computer Society, (2010)

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A Dynamic Power Management Algorithm for Sporadic Tasks in Real-Time Embedded Systems., , , and . Trustcom/BigDataSE/ISPA, page 2073-2078. IEEE, (2016)Scan based speed-path debug for a microprocessor., , , , , , and . European Test Symposium, page 207-212. IEEE Computer Society, (2010)Efficient Cell-Aware Defect Characterization for Multi-bit Cells., , , and . ITC-Asia, page 7-12. IEEE, (2018)At-Speed Scan Test Method for the Timing Optimization and Calibration., , and . Asian Test Symposium, page 430-433. IEEE Computer Society, (2009)On Improving a Fault Simulation Based Test Generator for Synchronous Sequential Circuits., , and . Asian Test Symposium, page 82-. IEEE Computer Society, (2001)Sentence-Level or Token-Level? A Comprehensive Study on Knowledge Distillation., , , , , and . CoRR, (2024)Proptest: A Property Based Test Pattern Generator for Sequential Circuits Using Test Compaction., , and . DAC, page 653-659. ACM Press, (1999)Research on tool swept volume in NC simulation., , , , and . EMEIT, page 2687-2690. IEEE, (2011)Diagnosis and Yield Learning., , , and . ITC-Asia, page 1. IEEE, (2021)Data cleansing for energy-saving: a case of Cyber-Physical Machine Tools health monitoring system., , , , and . Int. J. Prod. Res., 56 (1-2): 1000-1015 (2018)