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Disambiguation of "Plana, Robert"

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Information Retrieval Using Domain Adapted Language Models: Application to Resume Documents for HR Recruitment Assistance.

, , , , , , , , and . ICCSA (Workshops 1), volume 14104 of Lecture Notes in Computer Science, page 440-457. Springer, (2023)

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Juliana Plana Borrás

Lara Planas Paz

Emmanuel Planas

Robert Wille

Towards a design flow for reversible logic. Uni Bremen, (2009)

Robert Klöfkorn

Numerics for evolution equations: a general interface based design concept. Uni Freiburg, (2009)
 

Other publications of authors with the same name

System Architecture Modeling of an UWB Receiver for Wireless Sensor Network., , and . SAMOS, volume 4599 of Lecture Notes in Computer Science, page 408-420. Springer, (2007)Information Retrieval Using Domain Adapted Language Models: Application to Resume Documents for HR Recruitment Assistance., , , , , , , , and . ICCSA (Workshops 1), volume 14104 of Lecture Notes in Computer Science, page 440-457. Springer, (2023)79GHz Push-Push oscillators in 0.13μm SiGe BiCMOS technology., , , , , and . ICECS, page 1071-1074. IEEE, (2008)Simulation Platform for Wireless Sensor Networks Based on Impulse Radio Ultra Wide Band., , , and . ICN, page 61-66. IEEE Computer Society, (2009)Electrostatic discharge failure analysis of capacitive RF MEMS switches., , , , , , and . Microelectron. Reliab., 47 (9-11): 1818-1822 (2007)FPGA Based High Date Rate Radio Interfaces for Aerospace Wireless Sensor Systems., , and . ICONS, page 173-178. IEEE Computer Society, (2009)A 5.4GHz 0.35µm BiCMOS FBAR Resonator Oscillator in Above-IC Technology., , , , and . ISSCC, page 1228-1235. IEEE, (2006)Towards a contribution to the early V&V and evaluation of architectural solutions for Nuclear Infrastructures project delivery., , , , , and . ETFA, page 897-904. IEEE, (2020)Capacitive RF MEMS analytical predictive reliability and lifetime characterization., , , , , , and . Microelectron. Reliab., 49 (9-11): 1304-1308 (2009)Methods to improve reliability of bulge test technique to extract mechanical properties of thin films., , , , and . Microelectron. Reliab., 50 (9-11): 1888-1893 (2010)