( en | de | ru )

 

Disambiguation of "Latorre, Laurent"

Author of the publication

copydeleteadd this publication to your clipboard
Per peers learning educational approach to teach industrial test to undergraduate students.

, , and . EWME, page 1-6. IEEE, (2016)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Federico Latorre

Federico Latorre

Javier Latorre

Sabine Latorre

Federico Latorre

 

Other publications of authors with the same name

Noise optimisation of a piezoresistive CMOS MEMS for magnetic field sensing., , , and . VLSI-SOC, volume 218 of IFIP Conference Proceedings, page 461-472. Kluwer, (2001)Exploration of a digital-based solution for the generation of 2.4GHz OQPSK test stimuli., , , , and . ETS, page 1-6. IEEE, (2021)Problem-Based Learning Approach to Teach Printed Circuit Boards Test., , and . ICL (1), volume 544 of Advances in Intelligent Systems and Computing, page 45-57. Springer, (2016)Industrial test project oriented education., , and . EDUCON, page 119-124. IEEE, (2016)A Closed-Loop Architecture with Digital Output for Convective Accelerometers., , , and . ISVLSI, page 51-56. IEEE Computer Society, (2008)Evaluation of the Oscillation-based Test Methodology for Micro-Electro-Mechanical Systems., , , and . VTS, page 439-444. IEEE Computer Society, (2002)Design, Characterization & Modelling of a CMOS Magnetic Field Sensor., , , , and . DATE, page 239-243. IEEE Computer Society / ACM, (1999)Digital generation of single tone FM/PM test stimuli: a theoretical analysis., , , , and . LATS, page 1-6. IEEE, (2024)Phase noise measurement on IF analog signals using standard digital ATE resources., , , and . NEWCAS, page 121-124. IEEE, (2014)Impact of Technology Spreading on MEMS design Robustness., , , , , , and . VLSI-SOC, volume 218 of IFIP Conference Proceedings, page 241-251. Kluwer, (2001)