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Disambiguation of "Slomovitz, Daniel"

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SIM Comparison of DC Resistance Standards at 1Ω, 1MΩ, and 1GΩ.

, , , , , , , , , , , , , and . IEEE Trans. Instrumentation and Measurement, 58 (4): 1188-1195 (2009)

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Daniel

Daniel

Daniel Wied

Zivilprozessuale Qualifikationsprobleme im Spannungsfeld von Vertrag und Delikt: ein Beitrag zur Auslegung nationalen Zivilprozessrechts in europäischer Perspektive. Uni Regensburg, (2009)

Daniel Dirkmann

In-vitro-Untersuchungen zum Effekt von Hypothermie und Azidose auf Variablen thrombelastometrischer Messungen der Blutgerinnung. Uni Duisburg-Essen, (2009)

Daniel Stanze

Systematische Analyse von Rezeptoren und Effektormechanismen der pulmonalen angeborenen Immunität. Uni Marburg, (2009)
 

Other publications of authors with the same name

On site calibration of current transformers., , , and . I2MTC, page 1245-1246. IEEE, (2014)Standard for electric distorted waveforms., , and . I2MTC, page 366-368. IEEE, (2014)Electronic compensation of inductive voltage dividers and standard voltage transformers.. IEEE Trans. Instrumentation and Measurement, 47 (2): 465-468 (1998)Signal processing for a standard harmonic analyzer., and . LASCAS, page 1-3. IEEE, (2015)Effects of stray capacitances on high voltage current transformers., , and . I2MTC, page 348-351. IEEE, (2014)Electronic system for increasing the accuracy of in-service instrument-current transformers.. IEEE Trans. Instrumentation and Measurement, 52 (2): 408-410 (2003)Measurement of Very Fast Transient Overvoltages in Current Transformers at Open Air HV Substations., , , , , , and . I2MTC, page 1-6. IEEE, (2021)High-Precision Self-Calibrating Current Transformer With Stray Capacitances Control., , , and . IEEE Trans. Instrum. Meas., (2021)Electronic error reduction system for clamp-on probes and measuring current transformers.. IEEE Trans. Instrumentation and Measurement, 49 (6): 1278-1281 (2000)SIM Comparison of DC Resistance Standards at 1Ω, 1MΩ, and 1GΩ., , , , , , , , , and 4 other author(s). IEEE Trans. Instrumentation and Measurement, 58 (4): 1188-1195 (2009)