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Disambiguation of "Mir, Salvador"

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Re-engineering hardware specifications by exploiting design semantics.

, and . EURO-DAC, page 336-341. IEEE Computer Society, (1994)

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Mir Ferdowsi

Michael Salvador

Salvador Herrador

Salvador Fernandes

Salvador Oberhaus

 

Other publications of authors with the same name

Guest Editorial., , and . J. Electron. Test., 22 (4-6): 311 (2006)Practical Harmonic Cancellation Techniques for the On-Chip Implementation of Sinusoidal Signal Generators for Mixed-Signal BIST Applications., , and . J. Electron. Test., 34 (3): 263-279 (2018)Low-cost EVM built-in test of RF transceivers., , , and . IDT, page 51-54. IEEE, (2014)Minimizing Test Frequencies for Linear Analog Circuits: New Models and Efficient Solution Methods., , , , and . VLSI-SoC (Selected Papers), volume 461 of IFIP Advances in Information and Communication Technology, page 188-207. Springer, (2013)Built-in-self-test techniques for MEMS., , and . Microelectron. J., 37 (12): 1591-1597 (2006)Pseudorandom BIST for test and characterization of linear and nonlinear MEMS., , , , and . Microelectron. J., 40 (7): 1054-1061 (2009)Practical Simulation Flow for Evaluating Analog/Mixed-Signal Test Techniques., , , , , and . IEEE Des. Test, 33 (6): 46-54 (2016)A Fully-Digital BIST Wrapper Based on Ternary Test Stimuli for the Dynamic Test of a 40 nm CMOS 18-bit Stereo Audio ΣΔ ADC., , , , , , , and . IEEE Trans. Circuits Syst. I Regul. Pap., 63-I (11): 1876-1888 (2016)Multivariate statistical techniques for analog parametric test metrics estimation., , , , and . DTIS, page 6-11. IEEE, (2013)Analog/RF test ordering in the early stages of production testing., , , and . VTS, page 25-30. IEEE Computer Society, (2012)