( en | de | ru )

 

Disambiguation

From post

копироватьудалитьдобавить публикацию в буфер
Reducing Power Consumption by Utilizing Retransmission in Short Range Wireless Network.

, и . LCN, стр. 527-533. IEEE Computer Society, (2002)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

Chi-Yuan Hsiao

Lojen Hsiao

Kaijen Hsiao

Michael Kai Mikai Hsiao

He-Hsuan Hsiao

 

Другие публикации лиц с тем же именем

Multiplexed trace signal selection using non-trivial implication-based correlation., и . ISQED, стр. 697-704. IEEE, (2010)Fast Static Compaction Algorithms for Sequential Circuit Test Vectors., , и . IEEE Trans. Computers, 48 (3): 311-322 (1999)Efficient techniques for transition testing., , , и . ACM Trans. Design Autom. Electr. Syst., 10 (2): 258-278 (2005)A Test Pattern Quality Metric for Diagnosis of Multiple Stuck-at and Transition faults., , и . ACM Great Lakes Symposium on VLSI, стр. 455-458. ACM, (2017)Mining Sequential Constraints for Pseudo-Functional Testing., и . ATS, стр. 19-24. IEEE, (2007)Hybrid Rule-based and Machine Learning System for Assertion Generation from Natural Language Specifications., и . ATS, стр. 126-131. IEEE, (2022)SAT-based equivalence checking of threshold logic designs for nanotechnologies., , и . ACM Great Lakes Symposium on VLSI, стр. 225-230. ACM, (2008)Branch guided functional test generation at the RTL., , и . ETS, стр. 1-6. IEEE, (2015)Bilateral Testing of Nano-scale Fault-Tolerant Circuits., и . J. Electron. Test., 24 (1-3): 285-296 (2008)State Variable Extraction and Partitioning to Reduce Problem Complexity for ATPG and Design Validation., и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 25 (10): 2275-2282 (2006)