( en | de | ru )

 

Disambiguation

From post

копироватьудалитьдобавить публикацию в буфер
Analog-to-digital converter based on single-electron tunneling transistors.

, , , и . IEEE Trans. Very Large Scale Integr. Syst., 12 (11): 1209-1213 (2004)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

Sebastian Cotofana

Julia Sorina-Müller

Kai Söring

Julia Sorina-Müller

Jürgen Söring

 

Другие публикации лиц с тем же именем

On Carving Basic Boolean Functions on Graphene Nanoribbons Conduction Maps., , и . ISCAS, стр. 1-5. IEEE, (2018)Lifetime reliability assessment with aging information from low-level sensors., , и . ACM Great Lakes Symposium on VLSI, стр. 339-340. ACM, (2013)A direct measurement scheme of amalgamated aging effects with novel on-chip sensor., , и . VLSI-SoC, стр. 246-251. IEEE, (2013)An Efficient FPGA Design of Residue-to-Binary Converter for the Moduli Set 2n+1, 2n, 2n-1., , и . IEEE Trans. Very Large Scale Integr. Syst., 19 (8): 1500-1503 (2011)Compositional Memory Systems for Multimedia Communicating Tasks., , , и . DATE, стр. 932-937. IEEE Computer Society, (2005)Towards heterogenous 3D-stacked reliable computing with von Neumann multiplexing., и . NANOARCH, стр. 122-127. IEEE Computer Society, (2013)Statistical reliability analysis of NBTI impact on FinFET SRAMs and mitigation technique using independent-gate devices., , и . NANOARCH, стр. 109-115. ACM, (2012)Single Electron Tunneling Delay Insensitive and fluctuation based computation paradigms and circuits., , и . NANOARCH, стр. 69-76. IEEE Computer Society, (2008)Analysis of analog to digital converter based on single-electron tunnelling transistors., , и . ISCAS (3), стр. 693-696. IEEE, (2004)A Pragmatic Gaze on Stochastic Resonance Based Variability Tolerant Memristance Enhancement., , , и . ISCAS, стр. 1-5. IEEE, (2019)