( en | de | ru )

 

Disambiguation of "Bracho, Salvador"

Author of the publication

copydeleteadd this publication to your clipboard
Hard-to-Detect Faults by Dinamic Current Sensor in Analogue Circuits.

, , , and . LATW, page 180-185. IEEE, (2002)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Michael Salvador

Salvador Herrador

Salvador Oberhaus

Salvador Fernandes

Salvador Millaleo

 

Other publications of authors with the same name

Hard-to-Detect Faults by Dinamic Current Sensor in Analogue Circuits., , , and . LATW, page 180-185. IEEE, (2002)Structural DfT Strategy for High-Speed ADCs., , , and . DoCEIS, volume 314 of IFIP Advances in Information and Communication Technology, page 531-538. Springer, (2010)Design-for-Test method for high-speed ADCs: Behavioral description and optimization., , , and . DDECS, page 35-40. IEEE Computer Society, (2011)Test of embedded analog circuits based on a built-in current sensor., , , and . ETS, page 164-169. IEEE Computer Society, (2010)A Method for Designing a Deterministic Test Pattern Generator Based on Cellular Automata., , and . J. Electron. Test., 14 (3): 245-258 (1999)On Line IC Test Course With Distance Access to Test Equipment., , , and . LATW, IEEE, (2001)Test Based on Built-In Current Sensors for Mixed-Signal Circuits., , , and . DoCEIS, volume 314 of IFIP Advances in Information and Communication Technology, page 523-530. Springer, (2010)Modeling of faulty implantable MEMS pressure sensors., , , and . ICM, page 80-83. IEEE, (2014)Built-In Dynamic Current Sensor for Hard-to-Detect Faults in Mixed-Signal Ics., , , and . DATE, page 205-211. IEEE Computer Society, (2002)Iddt testing of continuous-time filters., , , , and . VTS, page 101-107. IEEE Computer Society, (1995)