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Examination of different adder structures concerning di/dt in a 180nm technology., и . EMC Compo, стр. 103-108. IEEE, (2015)Low power Real Time Clock with high accuracy over large supply voltage range., , , , , и . NORCHIP, стр. 1-4. IEEE, (2012)Automatic debug circuit for FPGA rapid prototyping., , , и . SISY, стр. 155-160. IEEE, (2015)EMV elektronischer Unterbaugruppen und integrierter Schaltkreise im Kraftfahrzeug., , , , и . EMV, стр. 373-380. VDE-Verlag, (2006)Vergleichende EMV-Untersuchungen auf Geräte- und IC-Ebene., , , и . Elektrotech. Informationstechnik, 123 (1-2): 9-14 (2006)Hybrid FPGA debug approach., , , и . FPL, стр. 1-8. IEEE, (2015)Robust and efficient design plan for integrated differential negative-Gm LC VCOs., , , и . MIXDES, стр. 386-389. IEEE, (2015)Simulation model based on JEDEC JS-001-2014 for circuit simulation of HBM ESD pulses on IC level., и . EMC Compo, стр. 202-206. IEEE, (2015)CMOS output drivers with reduced ground bounce and electromagnetic emission., и . ESSCIRC, стр. 537-540. IEEE, (2003)TEM-cell and surface scan to identify the electromagnetic emission of integrated circuits., и . ACM Great Lakes Symposium on VLSI, стр. 76-79. ACM, (2003)