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A 1.1V 16Gb DDR5 DRAM with Probabilistic-Aggressor Tracking, Refresh-Management Functionality, Per-Row Hammer Tracking, a Multi-Step Precharge, and Core-Bias Modulation for Security and Reliability Enhancement.

W. Kim, C. Jung, S. Yoo, D. Hong, J. Hwang, J. Yoon, O. Jung, J. Choi, S. Hyun, M. Kang, S. Lee, D. Kim, S. Ku, D. Choi, N. Joo, S. Yoon, J. Noh, B. Go, C. Kim, S. Hwang, M. Hwang, S. Yi, H. Kim, S. Heo, Y. Jang, K. Jang, S. Chu, Y. Oh, K. Kim, J. Kim, S. Kim, J. Hwang, S. Park, J. Lee, I. Jeong, J. Cho, and J. Kim. ISSCC, page 414-415. IEEE, (2023)

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Ky ng Kim

Die Artikelstruktur in passiven zweisprachigen Wörterbüchern Deutsch-Koreanisch: Konzeption zur Erstellung eines zweisprachigen Lernerwörterbuchs Deutsch-KoreanischK. Kim. Uni Heidelberg, (2008)

Bongcheol Kim

Kim Gerber

Ryong Kim

Sunghun Kim

Other publications of authors with the same name

On-line monitoring of system health using on-chip SRAMs as a wearout sensor.W. Kim, T. Liu, and L. Milor. IOLTS, page 253-258. IEEE, (2017)A 1.1V 16Gb DDR5 DRAM with Probabilistic-Aggressor Tracking, Refresh-Management Functionality, Per-Row Hammer Tracking, a Multi-Step Precharge, and Core-Bias Modulation for Security and Reliability Enhancement.W. Kim, C. Jung, S. Yoo, D. Hong, J. Hwang, J. Yoon, O. Jung, J. Choi, S. Hyun, M. Kang and 27 other author(s). ISSCC, page 414-415. IEEE, (2023)Estimation of remaining life using embedded SRAM for wearout parameter extraction.W. Kim, C. Chen, T. Liu, S. Cha, and L. Milor. IWASI, page 243-248. IEEE, (2015)MBIST and statistical hypothesis test for time dependent dielectric breakdowns due to GOBD vs. BTDDB in an SRAM array.W. Kim, C. Chen, S. Cha, and L. Milor. VTS, page 1-6. IEEE Computer Society, (2015)Built-in self test methodology for diagnosis of backend wearout mechanisms in SRAM cells.W. Kim, and L. Milor. VTS, page 1-6. IEEE Computer Society, (2014)

BibSonomy

Disambiguation of "Kim, Woongrae"