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Smart Hammering: A practical method of pinhole detection in MRAM memories.

, , , , и . DATE, стр. 1-6. IEEE, (2023)

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Martin Keim

Martin Keim

Martin Keim

Martin Keim

Martin Keim

 

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Exploring and Comparing IEEE P1687.1 and IEEE 1687 Modeling of Non-TAP Interfaces., , , , и . ETS, стр. 1-10. IEEE, (2021)Smart Hammering: A practical method of pinhole detection in MRAM memories., , , , и . DATE, стр. 1-6. IEEE, (2023)Fast Bring-Up of an AI SoC through IEEE 1687 Integrating Embedded TAPs and IEEE 1500 Interfaces., , , , , , , , , и . ITC, стр. 1-5. IEEE, (2020)Scan Diagnosis and Its Successful Industrial Applications., , , , и . ATS, стр. 215. IEEE, (2007)Convolutional Compaction-Based MRAM Fault Diagnosis., , , , и . ETS, стр. 1-6. IEEE, (2021)MBIST Supported Multi Step Trim for Reliable eMRAM Sensing., , , , , , и . ITC, стр. 1-5. IEEE, (2020)Adapting an industrial memory BIST solution for testing CAMs., , , , , , , и . ITC-Asia, стр. 112-117. IEEE, (2017)MBIST Support for Reliable eMRAM Sensing., , , , и . ETS, стр. 1-6. IEEE, (2020)A scalable BIST architecture for delay faults., , , и . ETW, стр. 98-103. IEEE Computer Society, (1999)Multi-Level Reference for Test Coverage Enhancement of Resistive-Based NVM., , , и . VTS, стр. 1-7. IEEE, (2024)