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Disambiguation of "Stellari, Franco"

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Novel IC Sub-Threshold IDDQ Signature And Its Relationship To Aging During High Voltage Stress.

, , and . ESSDERC, page 250-253. IEEE, (2018)

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Franco Kämmer

Franco Nüske

Franco Nüske

Franco Caldarone

Franco Lehmann

 

Other publications of authors with the same name

High-Voltage and High-Power PLL Diagnostics using Advanced Cooling and Emission Images., , , , , , , and . ITC, page 1-10. IEEE Computer Society, (2006)Time-integrated photon emission as a function of temperature in 32 nm CMOS., , , , , , and . IRPS, page 2. IEEE, (2015)A Novel Scan Chain Diagnostics Technique Based on Light Emission from Leakage Current., , , and . ITC, page 140-147. IEEE Computer Society, (2004)A high sensitivity process variation sensor utilizing sub-threshold operation., , , , and . CICC, page 125-128. IEEE, (2008)MARVEL - Malicious alteration recognition and verification by emission of light., , , , , , , and . HOST, page 117-121. IEEE Computer Society, (2011)Innovate Practices on CyberSecurity of Hardware Semiconductor Devices., , , , , , , , , and 4 other author(s). VTS, page 1. IEEE, (2019)Tester-based optical and electrical diagnostic system and techniques., and . VTS, page 209-214. IEEE Computer Society, (2012)Filament Localization and Characterization in Hf02 ReRAM Cells using Laser Stimulation., , , , , and . ESSDERC, page 293-296. IEEE, (2022)Reliability Study of 14 nm Scan Chains and Its Application to Hardware Security., and . ITC, page 28-35. IEEE, (2022)On-chip power supply noise measurement using Time Resolved Emission (TRE) waveforms of Light Emission from Off-State Leakage Current (LEOSLC)., , , , , and . ITC, page 1-10. IEEE Computer Society, (2009)