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Quality Assessment Model for Critical Manufacturing Process of Crystal Oscillator.

K. Chen, C. Wang, Y. Lin, C. Yu, и H. Shih. IEA/AIE, том 7906 из Lecture Notes in Computer Science, стр. 635-643. Springer, (2013)

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The Tires Worn Monitoring Prototype System Using Image Clustering Technology.S. Huang, Y. Chen, K. Chen, и H. Shih. IEA/AIE, том 7906 из Lecture Notes in Computer Science, стр. 626-634. Springer, (2013)Quality Assessment Model for Critical Manufacturing Process of Crystal Oscillator.K. Chen, C. Wang, Y. Lin, C. Yu, и H. Shih. IEA/AIE, том 7906 из Lecture Notes in Computer Science, стр. 635-643. Springer, (2013)