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Solutions to Multiple Probing Challenges for Test Access to Multi-Die Stacked Integrated Circuits.

, , , , , and . ITC, page 1-10. IEEE, (2018)

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Calgary Workshop in Discrete Geometry (Friday, May 13, 2005 to Saturday, May 14, 2005)., , and . Period. Math. Hung., 53 (1-2): 15-25 (2006)Accurate Measurements of Small Resistances in Vertical Interconnects with Small Aspect Ratios., , and . ETS, page 1-6. IEEE, (2020)Sylvester-type theorems for unit circles., , and . Discret. Math., 241 (1-3): 97-101 (2001)Perimeter Approximation of Convex Discs in the Hyperbolic Plane and on the Sphere.. Discret. Comput. Geom., 66 (3): 1190-1201 (2021)The development of a pneumatically actuated driving simulator., , and . AQTR, page 1-6. IEEE, (2016)Foreword., , and . Period. Math. Hung., 53 (1-2): 1 (2006)Testing Embedded Toggle Generation Through On-Chip IR-Drop Measurements., , , , , , and . IEEE Des. Test, 39 (5): 79-87 (2022)A fully automatic test system for characterizing large-array fine-pitch micro-bump probe cards., , , , , and . ITC-Asia, page 144-149. IEEE, (2017)Testing Embedded Toggle Pattern Generation Through On-Chip IR Drop Monitoring., , , , , and . ETS, page 1-4. IEEE, (2021)Solutions to Multiple Probing Challenges for Test Access to Multi-Die Stacked Integrated Circuits., , , , , and . ITC, page 1-10. IEEE, (2018)