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Intelligent Monitoring System for Universal Data Collection and Analysis.

, , , , , and . RADIOELEKTRONIKA, page 1-6. IEEE, (2022)

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Increasing the efficiency of analog OBIST using on-chip compensation of technology variations., , , and . DDECS, page 71-74. IEEE Computer Society, (2011)OBIST strategy versus parametric test - Efficiency in covering catastrophic faults in active analog filters., , , and . DDECS, page 193-194. IEEE, (2012)Numerical method for DC fault analysis simplification and simulation time reduction., , and . DDECS, page 170-174. IEEE Computer Society, (2013)Intelligent Monitoring System for Universal Data Collection and Analysis., , , , , and . RADIOELEKTRONIKA, page 1-6. IEEE, (2022)A novel impedance calculation method and its time efficiency evaluation., , , , and . DDECS, page 99-103. IEEE Computer Society, (2014)Comparison of iddt test efficiency in covering opens in SRAMs realised in two different technologies., , , and . DDECS, page 395-396. IEEE Computer Society, (2011)BIST architecture for oscillation test of analog ICs and investigation of test hardware influence., , , , , and . Microelectron. Reliab., 54 (5): 985-992 (2014)Application of IDDT test towards increasing SRAM reliability in nanometer technologies., , , and . DDECS, page 167-170. IEEE, (2012)Efficiency of oscillation-based BIST in 90nm CMOS active analog filters., , , and . DDECS, page 263-266. IEEE Computer Society, (2013)