From post

The lattice-based screen set: a square N-color all-orders Moiré-free screen set.

, , , , и . Color Imaging: Displaying, Processing, Hardcopy, and Applications, том 8292 из SPIE Proceedings, стр. 82920Y. SPIE, (2012)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

 

Другие публикации лиц с тем же именем

Clustered-dot halftoning with direct binary search., , , , , и . Color Imaging: Displaying, Processing, Hardcopy, and Applications, том 7528 из SPIE Proceedings, стр. 752812. SPIE, (2010)Design of color screen sets for robustness to color plane misregistration., , , , , и . ICIP, стр. 1733-1736. IEEE, (2011)Design of color screen tile vector sets., , , , , , и . Color Imaging: Displaying, Processing, Hardcopy, and Applications, том 7866 из SPIE Proceedings, стр. 78661C. SPIE, (2011)Electro-photographic model based stochastic clustered-dot halftoning with direct binary search., , , , , , и . ICIP, стр. 1721-1724. IEEE, (2011)The lattice-based screen set: a square N-color all-orders Moiré-free screen set., , , , и . Color Imaging: Displaying, Processing, Hardcopy, and Applications, том 8292 из SPIE Proceedings, стр. 82920Y. SPIE, (2012)Stochastic clustered-dot screen design for improved smoothness., , , , , , и . Color Imaging: Displaying, Processing, Hardcopy, and Applications, том 7866 из SPIE Proceedings, стр. 78661B. SPIE, (2011)Measuring the modulation transfer function of image capture devices: what do the numbers really mean?, , , , , , , и . IQSP, том 8293 из SPIE Proceedings, стр. 829307. SPIE, (2012)Electro-photographic-model-based halftoning., , , , , , , и . Color Imaging: Displaying, Processing, Hardcopy, and Applications, том 7528 из SPIE Proceedings, стр. 752810. SPIE, (2010)Frequency domain design of cluster dot screens., и . Color Imaging: Processing, Hardcopy, and Applications, том 6058 из SPIE Proceedings, стр. 60580U. SPIE, (2006)A robust similarity measure for automatic inspection., , , и . ICIP, стр. 2489-2492. IEEE, (2010)