( en | de | ru )

 

Disambiguation of "Waseda, Atsushi"

Author of the publication

copydeleteadd this publication to your clipboard
A Framework for Secure and Trustworthy Data Management in Supply Chain.

, , , , , and . MobiWIS, volume 11673 of Lecture Notes in Computer Science, page 148-159. Springer, (2019)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Atsushi Imai

Atsushi Imai

Mika Waseda

Atsushi Yagi

Atsushi Fukui

 

Other publications of authors with the same name

Multiparty Simultaneous Quantum Identity Authentication Secure against Fake Signal Attacks.. IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 96-A (1): 166-170 (2013)Homogeneity Characterization of Lattice Spacing of Silicon Single Crystals., , , , and . IEEE Trans. Instrum. Meas., 64 (6): 1692-1695 (2015)An Automated Vulnerability Assessment Approach for WebAPI that Considers Requests and Responses., , , , , , , and . ICACT, page 423-430. IEEE, (2022)Uniformity Evaluation of Lattice Spacing of 28Si Single Crystals., , , , and . IEEE Trans. Instrum. Meas., 66 (6): 1304-1308 (2017)Comparison of density difference measurements at PTB and NMIJ., , , and . IEEE Trans. Instrumentation and Measurement, 54 (2): 877-881 (2005)Security Evaluation of Decision Tree Meets Data Anonymization., , , and . ICISSP, page 853-860. SCITEPRESS, (2024)POSTER: PRINCESS: A Secure Cloud File Storage System for Managing Data with Hierarchical Levels of Sensitivity., , , , , and . ACM Conference on Computer and Communications Security, page 1684-1686. ACM, (2015)A Framework for Secure and Trustworthy Data Management in Supply Chain., , , , , and . MobiWIS, volume 11673 of Lecture Notes in Computer Science, page 148-159. Springer, (2019)Quantum Detection of Wavelength Division Multiplexing Optical Coherent Signals in Lossy Channels., , , , , and . ARES, page 619-624. IEEE Computer Society, (2010)Profile Measurement of Polished Surface with Respect to a Lattice Plane of a Silicon Crystal Using a Self-Referenced Lattice Comparator., , and . IJAT, 5 (2): 179-184 (2011)