( en | de | ru )

 

Disambiguation

From post

копироватьудалитьдобавить публикацию в буфер
Performances VS Reliability: how to exploit Approximate Computing for Safety-Critical applications.

, , , и . IOLTS, стр. 291-294. IEEE, (2018)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

Fernanda Schneider

Fernanda Rodriguez

Antonio Lima

Silvio Romero Frej Fonseca Lima

Mourad Limam

 

Другие публикации лиц с тем же именем

Exploring the inherent fault tolerance of successive approximation algorithms under laser fault injection., , , и . LATS, стр. 1-6. IEEE, (2018)A broad strategy to detect crosstalk faults in network-on-chip interconnects., , , , и . VLSI-SoC, стр. 298-303. IEEE, (2010)Improving approximate-TMR using multi-objective optimization genetic algorithm., , , , , , и . LATS, стр. 1-6. IEEE, (2018)Applying TMR in Hardware Accelerators Generated by High-Level Synthesis Design Flow for Mitigating Multiple Bit Upsets in SRAM-Based FPGAs., , , , и . ARC, том 10216 из Lecture Notes in Computer Science, стр. 202-213. (2017)Applying lockstep in dual-core ARM Cortex-A9 to mitigate radiation-induced soft errors., , и . LASCAS, стр. 1-4. IEEE, (2017)Comparative Analysis of Inference Errors in a Neural Network Implemented in SRAM-Based FPGA Induced by Neutron Irradiation and Fault Injection Methods., , , , и . SBCCI, стр. 1-6. IEEE, (2018)Combining fault tolerance and serialization effort to improve yield in 3D Networks-on-Chip., , , , , , , , и . ICECS, стр. 125-128. IEEE, (2013)Application-Based Analysis of Register File Criticality for Reliability Assessment in Embedded Microprocessors., , , , и . J. Electron. Test., 31 (2): 139-150 (2015)Exploiting approximate computing for low-cost fault tolerant architectures., , , , и . SBCCI, стр. 3. ACM, (2019)Investigating Floating-Point Implementations in a Softcore GPU under Radiation-Induced Faults., , , , , , и . ICECS, стр. 1-4. IEEE, (2020)