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Disambiguation of "Kumashiro, Shigetaka"

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Exhaustive and Systematic Accuracy Verification and Enhancement of STI Stress Compact Model for General Realistic Layout Patterns.

, , , , , , and . IEICE Trans. Electron., 93-C (8): 1349-1358 (2010)

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Correlation method of circuit-performance and technology fluctuations for improved design reliability., , , , , , , , , and . ASP-DAC, page 39-44. ACM, (2001)Circuit Simulation Models for Coming MOSFET Generations., , , , , , and . IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 85-A (4): 740-748 (2002)MOSFET harmonic distortion analysis up to the non-quasi-static frequency regime., , , , , , , , , and . CICC, page 827-830. IEEE, (2005)HiSIM-RP: A reverse-profiling based 1st principles compact MOSFET model and its application to variability analysis of 90nm and 40nm CMOS., , , , and . ISQED, page 553-560. IEEE, (2012)Exhaustive and Systematic Accuracy Verification and Enhancement of STI Stress Compact Model for General Realistic Layout Patterns., , , , , , and . IEICE Trans. Electron., 93-C (8): 1349-1358 (2010)Ultra Long-term Measurement Results of BTI-induced Aging Degradation on 7-nm Ring Oscillators., , , , , , , and . IRPS, page 1-7. IEEE, (2023)A predictable compact model for non-monotonous Vth-Pelgrom plot of long channel halo-implanted transistors.. ISQED, page 391-397. IEEE, (2013)Temperature-independence-point properties for 0.1μm-scale pocket-implant technologies and the impact on circuit design., , , , , , , , , and . ASP-DAC, page 179-183. ACM, (2003)Accurate analysis of substrate sensitivity of active transistors in an analog circuit., , , , , , , , and . ISQED, page 56-61. IEEE, (2011)Asymptotic waveform evaluation for transient analysis of 3-D interconnect structures., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 12 (7): 988-996 (1993)