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Embedded Boundary Scan., and . IEEE Des. Test Comput., 20 (2): 20-25 (2003)JTAG-based vector and chain management for system test., , and . ITC, page 10. IEEE Computer Society, (2005)Test Reuse at System Level., , , , and . VTS, page 318-319. IEEE Computer Society, (1998)A Comparative Analysis of the Best Practices of South Korea and Philippine Education. International Journal of Trend in Scientific Research and Development, 4 (1): 137-140 (December 2019)