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Efficient diagnosis technique for aging defects on automotive semiconductor chips.

, , , , and . ETS, page 1-2. IEEE, (2015)

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The educational use of home robots for children., , , and . RO-MAN, page 378-383. IEEE, (2005)On Diagnosing the Aging Level of Automotive Semiconductor Devices., , , , and . IEEE Trans. Circuits Syst. II Express Briefs, 64-II (7): 822-826 (2017)Interconnect Delay Fault Test on Boards and SoCs with Multiple Clock Domains., , and . ITC, page 1-7. IEEE Computer Society, (2006)An Efficient Secure Scan Design for an SoC Embedding AES Core., , , , , and . ITC, page 1. IEEE Computer Society, (2008)An Efficient Buffer Allocation Technique for Virtual Lanes in InfiniBand Networks., , , and . Human.Society@Internet 2003, volume 2713 of Lecture Notes in Computer Science, page 272-281. Springer, (2003)Why is less information from logic simulation more useful in fault simulation?, , , and . ITC, page 786-800. IEEE Computer Society, (1990)Design of Test Access Mechanism for AMBA-Based System-on-a-Chip., , , and . VTS, page 375-380. IEEE Computer Society, (2007)An Efficient Link Controller for Test Access to IP Core-Based Embedded System Chips., , , and . Asia-Pacific Computer Systems Architecture Conference, volume 4697 of Lecture Notes in Computer Science, page 139-150. Springer, (2007)Test Architecture for Systolic Array of Edge-Based AI Accelerator., , , , and . IEEE Access, (2021)A New IEEE 1149.1 Boundary Scan Design for the Detection of Delay Defects., and . DATE, page 458-462. IEEE Computer Society / ACM, (2000)