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Test-Quality Optimization for Variable $n$ -Detections of Transition Faults., , , , , и . IEEE Trans. Very Large Scale Integr. Syst., 22 (8): 1738-1749 (2014)A Simulation-Based Method for Generating Tests for Sequential Circuits., , и . IEEE Trans. Computers, 39 (12): 1456-1463 (1990)STOIC: state assignment based on output/input functions., и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 12 (8): 1123-1131 (1993)Perturb and simplify: multilevel Boolean network optimizer., , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 15 (12): 1494-1504 (1996)An Accurate Jitter Estimation Technique for Efficient High Speed I/O Testing., и . ATS, стр. 224-229. IEEE, (2007)PBIR: perception-based image retrieval-a system that can quickly capture subjective image query concepts., , , , , и . ACM Multimedia, стр. 611-614. ACM, (2001)Contest: A Concurrent Test Generator for Sequential Circuits., , и . DAC, стр. 84-89. ACM, (1988)On the Over-Specification Problem in Sequential ATPG Algorithms., и . DAC, стр. 16-21. IEEE Computer Society Press, (1992)Guest Editorial., , и . J. Electron. Test., 11 (1): 7-8 (1997)Finite state machine synthesis with embedded test function., и . J. Electron. Test., 1 (3): 221-228 (1990)