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The Effect on Quality of Non-Uniform Fault Coverage and Fault Probability.

, , and . ITC, page 739-746. IEEE Computer Society, (1994)

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Total Critical Area Based Testing., and . ITC, page 1-10. IEEE, (2018)The use of IDDQ testing in low stuck-at coverage situations.. VTS, page 84-88. IEEE Computer Society, (1995)Best Methods for At-Speed Testing?, , , , and . VTS, page 460-461. IEEE Computer Society, (1998)Let's Grade ALL the Faults.. ITC, page 595. IEEE Computer Society, (1993)The Heisenberg Uncertainty of Test.. ITC, page 13. IEEE Computer Society, (2002)Deception by design: fooling ourselves with gate-level models., and . ITC, page 921-929. IEEE Computer Society, (2000)Defect-Oriented Test: Effectiveness in High Volume Manufacturing., , , , , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 40 (3): 584-597 (2021)Quality impacts of non-uniform fault coverage.. VTS, page 197-200. IEEE Computer Society, (1994)Current ratios: a self-scaling technique for production IDDQ testing., , , , , , and . ITC, page 1148-1156. IEEE Computer Society, (2000)The Interaction of Test and Quality.. ITC, page 1120. IEEE Computer Society, (1991)