From post

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

 

Другие публикации лиц с тем же именем

Light-Weight Cipher Based on Hybrid CMOS/STT-MRAM: Power/Area Analysis., , , , , , и . ISCAS, стр. 1-5. IEEE, (2019)Dual Detection of Heating and Photocurrent attacks (DDHP) Sensor using Hybrid CMOS/STT-MRAM., , , , , , и . IOLTS, стр. 322-327. IEEE, (2019)Physical Fault Injection and Side-Channel Attacks on Mobile Devices: A Comprehensive Survey., , , , , , и . CoRR, (2021)MRAM: from STT to SOT, for security and memory., , , , , , , , и . DCIS, стр. 1-6. IEEE, (2018)Physical fault injection and side-channel attacks on mobile devices: A comprehensive analysis., , , , , , и . Comput. Secur., (2021)Electromagnetic Fault Injection as a New Forensic Approach for SoCs., , , , и . WIFS, стр. 1-6. IEEE, (2020)Combined Fault Injection and Real-Time Side-Channel Analysis for Android Secure-Boot Bypassing., , , , и . CARDIS, том 13820 из Lecture Notes in Computer Science, стр. 25-44. Springer, (2022)Exploration of System-on-Chip Secure-Boot Vulnerability to Fault-Injection by Side-Channel Analysis., , , и . DFT, стр. 1-6. IEEE, (2023)ElectroMagnetic analysis (EMA) of software AES on Java mobile phones., , , , , и . WIFS, стр. 1-6. IEEE Computer Society, (2011)Impact of a Laser Pulse on a STT-MRAM Bitcell: Security and Reliability Issues., , , , , , , , и . IOLTS, стр. 243-244. IEEE, (2018)