( en | de | ru )

 

Disambiguation of "Kim, Taehyung"

Author of the publication

copydeleteadd this publication to your clipboard
Traffic Flow Forecasting Based on Pattern Recognition to Overcome Memoryless Property.

, , , and . MUE, page 1181-1186. IEEE Computer Society, (2007)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Taehyung Park

Ky ng Kim

Die Artikelstruktur in passiven zweisprachigen Wörterbüchern Deutsch-Koreanisch: Konzeption zur Erstellung eines zweisprachigen Lernerwörterbuchs Deutsch-Koreanisch. Uni Heidelberg, (2008)

Kison Kim

Sunghun Kim

Taekwan Kim

 

Other publications of authors with the same name

Open-Circuit Switch-Fault Tolerant Control of a Modified Boost DC-DC Converter for Alternative Energy Systems., , and . IEEE Access, (2019)Network massive MIMO for cell-boundary users: From a precoding normalization perspective., , , , and . GLOBECOM Workshops, page 233-237. IEEE, (2012)Hierarchy architecture security design for energy cloud., , , , and . ICTC, page 1187-1189. IEEE, (2017)Autonomous Robot Racing Competitions: Truly Multivehicle Autonomous Racing Competitions Competitions., , , , , , , , , and 10 other author(s). IEEE Robotics Autom. Mag., 31 (1): 123-132 (March 2024)Design of an Underactuated Peristaltic Robot on Soft Terrain., , , and . IROS, page 6419-6426. IEEE, (2020)DNN-based ISP Parameter Inference Algorithm for Automatic Image Quality Optimization., , , , , and . IQSP, Society for Imaging Science and Technology, (2020)Channel Estimation for Uplink SCMA Systems with Reduced Training Blocks., , , , and . VTC Spring, page 1-5. IEEE, (2018)Implementation of the Closed Plant Factory System Based on Crop Growth Model., , , , , , , and . MUE, volume 240 of Lecture Notes in Electrical Engineering, page 83-89. Springer, (2013)A Voltage and Temperature Tracking SRAM Assist Supporting 740mV Dual-Rail Offset for Low-Power and High-Performance Applications in 7nm EUV FinFET Technology., , , , , , , , , and 9 other author(s). ISSCC, page 392-394. IEEE, (2019)A New IEEE 1149.1 Boundary Scan Design for the Detection of Delay Defects., and . DATE, page 458-462. IEEE Computer Society / ACM, (2000)