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Built-in current testing-feasibility study.

, and . ICCAD, page 340-343. IEEE Computer Society, (1988)

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Prospects for WSI: A Manufacturing Perspective.. Computer, 25 (4): 58-65 (1992)Interconnect characteristics of 2.5-D system integration scheme., and . ISPD, page 171-175. ACM, (2001)Systematic Characterization of Physical Defects for Fault Analysis of MOS IC Cells., , and . ITC, page 390-399. IEEE Computer Society, (1984)Improving the Quality of Test Education.. ITC, page 1119. IEEE Computer Society, (1991)Fault Tuples in Diagnosis of Deep-Submicron Circuits., , , , , and . ITC, page 233-241. IEEE Computer Society, (2002)Modeling the Difficulty of Sequential Automatic Test Pattern Generation., and . ICCD, page 261-271. IEEE Computer Society, (1996)Improved Yield Model for Submicron Domain., and . DFT, page 2-10. IEEE Computer Society, (1997)Process Monitoring Oriented IC Testing., and . ITC, page 527-532. IEEE Computer Society, (1989)Current testing.. ITC, page 257. IEEE Computer Society, (1990)To DFT or Not to DFT?, , , , and . ITC, page 557-566. IEEE Computer Society, (1997)