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Fine-Grained In-Circuit Continuous-Time Probing Technique of Dynamic Supply Variations in SoCs.

, , , , , , , and . ISSCC, page 288-603. IEEE, (2007)

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A built-in power supply noise probe for digital LSIs., , , and . ASP-DAC, page 106-107. IEEE, (2006)A 24-OSR to Simplify Anti-Aliasing Filter 2MHz-BW 83dB-DR 3rd-order DT-DSM using FIA-Based Integrator and Noise-Shaping SAR Combined Digital Noise-Coupling Quantizer., and . VLSI Technology and Circuits, page 1-2. IEEE, (2023)Fine-Grained In-Circuit Continuous-Time Probing Technique of Dynamic Supply Variations in SoCs., , , , , , , and . ISSCC, page 288-603. IEEE, (2007)Delay Variation Analysis in Consideration of Dynamic Power Supply Noise Waveform., and . CICC, page 865-868. IEEE, (2006)A High-Precision Analog Front End Integrated in a 32bit Microcontroller for Industrial Sensing Applications., , , , , , , , , and 2 other author(s). A-SSCC, page 1-4. IEEE, (2020)9.7 Background Multi-Rate LMS Calibration Circuit for 15MHz-BW 74dB-DR CT 2-2 MASH ΔΣ ADC in 28nm CMOS., , , , , , , and . ISSCC, page 166-168. IEEE, (2020)Substrate-noise and random-fluctuations reduction with self-adjusted forward body bias., , , , , , and . CICC, page 35-38. IEEE, (2005)An integrated timing and dynamic supply noise verification for nano-meter CMOS SoC designs., , , , , , and . CICC, page 31-34. IEEE, (2005)