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Reliable Binarized Neural Networks on Unreliable Beyond Von-Neumann Architecture., , , , , and . IEEE Trans. Circuits Syst. I Regul. Pap., 69 (6): 2516-2528 (2022)On the Resiliency of NCFET Circuits Against Voltage Over-Scaling., , , , , , , and . IEEE Trans. Circuits Syst. I Regul. Pap., 68 (4): 1481-1492 (2021)Impact of NCFET on Neural Network Accelerators., , , , , and . IEEE Access, (2021)Unlocking Efficiency in BNNs: Global by Local Thresholding for Analog-Based HW Accelerators., , , , and . IEEE J. Emerg. Sel. Topics Circuits Syst., 13 (4): 940-955 (December 2023)Monolithic 3D Integrated BEOL Dual-Port Ferroelectric FET to Break the Tradeoff Between the Memory Window and the Ferroelectric Thickness., , and . IRPS, page 1-4. IEEE, (2023)On Extracting Reliability Information from Speed Binning., , , and . ETS, page 1-4. IEEE, (2022)Mitigating the Impact of Variability in NCFET-based Coupled-Oscillator Networks Applications., , , and . ICECS 2022, page 1-4. IEEE, (2022)ICCAD Tutorial Session Paper Ferroelectric FET Technology and Applications: From Devices to Systems., , , , , , , , , and 1 other author(s). ICCAD, page 1-8. IEEE, (2021)Security Closure of Physical Layouts ICCAD Special Session Paper., , , , , , , , and . ICCAD, page 1-9. IEEE, (2021)A Novel Approach to Mitigate Power Side-Channel Attacks for Emerging Negative Capacitance Transistor Technology., , , , and . NEWCAS, page 504-508. IEEE, (2022)