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Disambiguation of "Alam, Muhammad Ashraful"

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High voltage time-dependent dielectric breakdown in stacked intermetal dielectrics.

, , , , , , , , , and . IRPS, page 9-1. IEEE, (2018)

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Muhammad Mahboob Alam

Muhammad Muhammad

Masoom Alam

Homayun Alam

Fakhrul Alam

 

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Training a quantum annealing based restricted Boltzmann machine on cybersecurity data., , , , and . CoRR, (2020)Physics-guided machine learning predicts the planet-scale performance of solar farms with sparse, heterogeneous, public data., and . CoRR, (2024)OFF-state degradation and correlated gate dielectric breakdown in high voltage drain extended transistors: A review., , , and . Microelectron. Reliab., 54 (8): 1477-1488 (2014)Efficient Transistor-Level Sizing Technique under Temporal Performance Degradation due to NBTI., , , and . ICCD, page 216-221. IEEE, (2006)BVDSS (drain to source breakdown voltage) instability in shielded gate trench power MOSFETs., , , , and . IRPS, page 6. IEEE, (2018)Estimation of statistical variation in temporal NBTI degradation and its impact on lifetime circuit performance., , , and . ICCAD, page 730-734. IEEE Computer Society, (2007)Computing Nice Projections of Convex Polyhedra., and . Int. J. Comput. Geom. Appl., 21 (1): 71-85 (2011)A Novel 'I-V Spectroscopy' Technique to Deconvolve Threshold Voltage and Mobility Degradation in LDMOS Transistors., , , , , and . IRPS, page 1-6. IEEE, (2020)High voltage time-dependent dielectric breakdown in stacked intermetal dielectrics., , , , , , , , , and . IRPS, page 9-1. IEEE, (2018)Correlated Effects of Radiation and Hot Carrier Degradation on the Performance of LDMOS Transistors., , , , and . IRPS, page 52-1. IEEE, (2022)