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Study on listmode OSEM reconstruction including image-space resolution recovery techniques for compton camera., , , , , , , and . ISBI, page 796-799. IEEE, (2010)The Physics of the B Factories, , , , , , , , , and 2024 other author(s). The European Physical Journal C, (Jul 8, 2014)Reliability Characterization of HBM featuring $HK+MG$ Logic Chip with Multi-stacked DRAMs., , , , , , , , and . IRPS, page 1-7. IEEE, (2023)Search for a light pseudoscalar Higgs boson in the dimuon decay channel in pp collisions at √s = 7 TeV, , , , , , , , , and 2183 other author(s). Phys Rev Lett, 109 (12): 121801-121801 (September 2012)Thermo-Mechanical Reliability Characteristics of 8H HBM3., , , , , , , , , and 8 other author(s). IRPS, page 1-6. IEEE, (2024)Front-side and Back-side Power Delivery Network Guidelines for 2nm node High Perf Computing and Mobile SoC applications., , , , , , , , , and . VLSI Technology and Circuits, page 1-2. IEEE, (2023)Exploring Innovative IGZO-channel based DRAM Cell Architectures and Key Technologies for Sub-10nm Node., , , , , , , , , and 12 other author(s). IMW, page 1-4. IEEE, (2024)Development and Product Reliability Characterization of Advanced High Speed 14nm DDR5 DRAM with On-die ECC., , , , , , , , and . IRPS, page 1-4. IEEE, (2023)4.1 A 39GHz-Band CMOS 16-Channel Phased-Array Transceiver IC with a Companion Dual-Stream IF Transceiver IC for 5G NR Base-Station Applications., , , , , , , , , and 23 other author(s). ISSCC, page 76-78. IEEE, (2020)Reliability of 8Mbit Embedded-STT-MRAM in 28nm FDSOI Technology., , , , , , , , , and 13 other author(s). IRPS, page 1-3. IEEE, (2019)