Author of the publication

On-Line Testing of Digital Circuits for n-Detect and Bridging Fault Models.

, , , , , and . Asian Test Symposium, page 88-93. IEEE Computer Society, (2005)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

An efficient approach to model distortion in weakly nonlinear Gm - C filters., , , and . ISCAS, page 1312-1315. IEEE, (2008)A Methodology for Generation of Performance Models for the Sizing of Analog High-Level Topologies., , and . VLSI Design, (2011)Particle filtering based estimation of remaining useful life of lithium-ion batteries employing power fading data., and . ICPHM, page 193-198. IEEE, (2017)An automated high-level topology generation procedure for continuous-time SigmaDelta modulator., , and . Integr., 43 (3): 289-304 (2010)Comments on Öbservability of discrete event dynamic systems" by C. M. Ozveren and A.S. Willsky., , and . IEEE Trans. Autom. Control., (1993)Boundedness analysis of finitely recursive processes. I. Concurrent processes., , and . IEEE Trans. Autom. Control., 43 (11): 1514-1531 (1998)Estimation of dc Performance of a Lateral Power MOSFET Using Distributed Cell Model., , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 31 (9): 1452-1456 (2012)On-Line Testing of Digital Circuits for n-Detect and Bridging Fault Models., , , , , and . Asian Test Symposium, page 88-93. IEEE Computer Society, (2005)Optimization of the Theory of FDD of DES for Alleviation of the State Explosion Problem and Development of CAD Tools for On-line Testing of Digital VLSI Circuits., , and . IOLTS, page 184-. IEEE Computer Society, (2004)Particle Filtering framework for Health Monitoring of Lithium-Ion Batteries using Ampere-hour Throughput based Semi-Empirical Model., , , and . ICPHM, page 1-7. IEEE, (2021)