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On Interconnecting Circuits with Multiple Scan Chains for Improved Test Data Compression.

, и . VLSI Design, стр. 741-744. IEEE Computer Society, (2004)

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Sudhakar Peddireddi

Padhmanand Sudhakar

Edamakanti Chandrakanth Reddy

Malgi Prasad Reddy

Martin Reddy

 

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