Author of the publication

On Interconnecting Circuits with Multiple Scan Chains for Improved Test Data Compression.

, and . VLSI Design, page 741-744. IEEE Computer Society, (2004)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Universal delay test sets for logic networks., , and . IEEE Trans. Very Large Scale Integr. Syst., 7 (2): 156-166 (1999)Correcting Unidirectional Errors with Nonpositive Hopfield Networks., , and . ICNN, page 2933-2938. IEEE, (1995)Resynthesis for Avoiding Undetectable Faults Based on Design-for-Manufacturability Guidelines., , , , and . DATE, page 1022-1027. IEEE, (2019)Selection of a fault model for fault diagnosis based on unique responses., and . DATE, page 994-999. IEEE, (2009)Test Generation for Synchronous Sequential Circuits Using Multiple Observation Times., and . FTCS, page 52-59. IEEE Computer Society, (1991)EXOP (Extended Operation): A New Logical Fault Model for Digital Circuits., and . FTCS, page 166-175. IEEE Computer Society, (1993)Synthesis of Multi-Level Combinational Circuits for Complete Robust Path Delay Fault Testability., , , and . FTCS, page 280-287. IEEE Computer Society, (1992)On the design of robust testable CMOS combinational logic circuits., and . FTCS, page 220-225. IEEE Computer Society, (1988)A supervised machine learning application in volume diagnosis., , , , , , and . ETS, page 1-6. IEEE, (2019)Volume diagnosis data mining., , and . ETS, page 1-10. IEEE, (2017)