%0 Conference Paper %1 conf/iscit/OhamaYHHT17 %A Ohama, Yuuya %A Yotsuyanagi, Hiroyuki %A Hashizume, Masaki %A Higami, Yoshinobu %A Takahashi, Hiroshi %B ISCIT %D 2017 %I IEEE %K dblp %P 1-5 %T On selection of adjacent lines in test pattern generation for delay faults considering crosstalk effects. %U http://dblp.uni-trier.de/db/conf/iscit/iscit2017.html#OhamaYHHT17 %@ 978-1-5090-6514-1

@inproceedings{conf/iscit/OhamaYHHT17, added-at = {2018-01-31T00:00:00.000+0100}, author = {Ohama, Yuuya and Yotsuyanagi, Hiroyuki and Hashizume, Masaki and Higami, Yoshinobu and Takahashi, Hiroshi}, biburl = {https://www.bibsonomy.org/bibtex/21d3cb1f64f97c41840df30a1ba931a48/dblp}, booktitle = {ISCIT}, crossref = {conf/iscit/2017}, ee = {https://doi.org/10.1109/ISCIT.2017.8261186}, interhash = {d3f9efafc50d234f4cb7fcd58f2477ba}, intrahash = {1d3cb1f64f97c41840df30a1ba931a48}, isbn = {978-1-5090-6514-1}, keywords = {dblp}, pages = {1-5}, publisher = {IEEE}, timestamp = {2018-02-01T11:37:38.000+0100}, title = {On selection of adjacent lines in test pattern generation for delay faults considering crosstalk effects.}, url = {http://dblp.uni-trier.de/db/conf/iscit/iscit2017.html#OhamaYHHT17}, year = 2017 }