Article,
Extracting Defect Density and Size Distributions from Product ICs.
J. Nelson, T. Zanon, J. Brown, O. Poku, R. Blanton, W. Maly, B. Benware, and C. Schuermyer.IEEE Des. Test Comput., 23 (5): 390-400 (2006)
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- 2006
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- IEEE Des. Test Comput.
- number
- 5
- pages
- 390-400
- volume
- 23
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- http://doi.ieeecomputersociety.org/10.1109/MDT.2006.117
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- please select -%0 Journal Article
%1 journals/dt/NelsonZBPBMBS06
%A Nelson, Jeffrey E.
%A Zanon, Thomas
%A Brown, Jason G.
%A Poku, Osei
%A Blanton, R. D. (Shawn)
%A Maly, Wojciech
%A Benware, Brady
%A Schuermyer, Chris
%D 2006
%J IEEE Des. Test Comput.
%K dblp
%N 5
%P 390-400
%T Extracting Defect Density and Size Distributions from Product ICs.
%U http://dblp.uni-trier.de/db/journals/dt/dt23.html#NelsonZBPBMBS06
%V 23
@article{journals/dt/NelsonZBPBMBS06,
added-at = {2020-05-17T00:00:00.000+0200},
author = {Nelson, Jeffrey E. and Zanon, Thomas and Brown, Jason G. and Poku, Osei and Blanton, R. D. (Shawn) and Maly, Wojciech and Benware, Brady and Schuermyer, Chris},
biburl = {https://www.bibsonomy.org/bibtex/223ce9c4dd0510a9dec1acaf5aa213efb/dblp},
ee = {http://doi.ieeecomputersociety.org/10.1109/MDT.2006.117},
interhash = {d7ebb4028f70bd8dc35a177723195ce0},
intrahash = {23ce9c4dd0510a9dec1acaf5aa213efb},
journal = {IEEE Des. Test Comput.},
keywords = {dblp},
number = 5,
pages = {390-400},
timestamp = {2020-05-19T12:21:25.000+0200},
title = {Extracting Defect Density and Size Distributions from Product ICs.},
url = {http://dblp.uni-trier.de/db/journals/dt/dt23.html#NelsonZBPBMBS06},
volume = 23,
year = 2006
}