%0 Journal Article %1 journals/dt/NelsonZBPBMBS06 %A Nelson, Jeffrey E. %A Zanon, Thomas %A Brown, Jason G. %A Poku, Osei %A Blanton, R. D. (Shawn) %A Maly, Wojciech %A Benware, Brady %A Schuermyer, Chris %D 2006 %J IEEE Des. Test Comput. %K dblp %N 5 %P 390-400 %T Extracting Defect Density and Size Distributions from Product ICs. %U http://dblp.uni-trier.de/db/journals/dt/dt23.html#NelsonZBPBMBS06 %V 23

@article{journals/dt/NelsonZBPBMBS06, added-at = {2020-05-17T00:00:00.000+0200}, author = {Nelson, Jeffrey E. and Zanon, Thomas and Brown, Jason G. and Poku, Osei and Blanton, R. D. (Shawn) and Maly, Wojciech and Benware, Brady and Schuermyer, Chris}, biburl = {https://www.bibsonomy.org/bibtex/223ce9c4dd0510a9dec1acaf5aa213efb/dblp}, ee = {http://doi.ieeecomputersociety.org/10.1109/MDT.2006.117}, interhash = {d7ebb4028f70bd8dc35a177723195ce0}, intrahash = {23ce9c4dd0510a9dec1acaf5aa213efb}, journal = {IEEE Des. Test Comput.}, keywords = {dblp}, number = 5, pages = {390-400}, timestamp = {2020-05-19T12:21:25.000+0200}, title = {Extracting Defect Density and Size Distributions from Product ICs.}, url = {http://dblp.uni-trier.de/db/journals/dt/dt23.html#NelsonZBPBMBS06}, volume = 23, year = 2006 }