@inproceedings{conf/irps/LamaBBBNCGCNN21,
added-at = {2021-05-20T00:00:00.000+0200},
author = {Lama, Giusy and Bernard, Mathieu and Bernier, Nicolas and Bourgeois, Guillaume and Nolot, Emmanuel and Castellani, Niccolo and Garrione, Julien and Cyrille, Marie Claire and Navarro, Gabriele and Nowak, Etienne},
biburl = {https://www.bibsonomy.org/bibtex/26ca287cf69d5686630864108d982c010/dblp},
booktitle = {IRPS},
crossref = {conf/irps/2021},
ee = {https://doi.org/10.1109/IRPS46558.2021.9405116},
interhash = {e0d71b35a5775b7a4106b0a54d46158b},
intrahash = {6ca287cf69d5686630864108d982c010},
isbn = {978-1-7281-6893-7},
keywords = {dblp},
pages = {1-6},
publisher = {IEEE},
timestamp = {2024-04-09T12:18:55.000+0200},
title = {Multilevel Programming Reliability in Si-doped GeSbTe for Storage Class Memory.},
url = {http://dblp.uni-trier.de/db/conf/irps/irps2021.html#LamaBBBNCGCNN21},
year = 2021
}