Author of the publication

Die degradation effect on aging rate in accelerated cycling tests of SiC power MOSFET modules.

, , , and . Microelectron. Reliab., (2017)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Die degradation effect on aging rate in accelerated cycling tests of SiC power MOSFET modules., , , and . Microelectron. Reliab., (2017)The Effect of ICTs on Mobility and Environment in Urban Areas., , , and . ITEE, page 313-319. Springer, (2007)Xbox 360 System Architecture., and . IEEE Micro, 26 (2): 25-37 (2006)Junction temperature measurements via thermo-sensitive electrical parameters and their application to condition monitoring and active thermal control of power converters., , , and . IECON, page 942-948. IEEE, (2013)The Temperature Dependence of the Flatband Voltage in High-Power IGBTs., and . IEEE Trans. Ind. Electron., 66 (7): 5581-5584 (2019)Emotional agent model and architecture for NPCs group control and interaction to facilitate leadership roles in computer entertainment., , and . Advances in Computer Entertainment Technology, page 156-163. ACM, (2005)Smart SiC MOSFET accelerated lifetime testing., and . Microelectron. Reliab., (2018)Robust Design of Induction Machines for High-Speed Electric Freight Locomotive Applications., and . IEEE Access, (2024)An Overview of Modern Thermo-Conductive Materials for Heat Extraction in Electrical Machines., , and . IEEE Access, (2020)Empirical Implementation of the Steinmetz Equation to Compute Eddy Current Loss in Soft Magnetic Composite Components., , , , , and . IEEE Access, (2022)