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Reliability-Enhanced ECC-Based Memory Architecture Using In-Field Self-Repair.

, , , , and . IEICE Trans. Inf. Syst., 99-D (10): 2591-2599 (2016)

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SelfStabilizing WaitFree Clock Synchronization with Bounded Space., , , and . OPODIS, page 129-144. Hermes, (1998)Eventually Consistent Distributed Ledger Relying on Degraded Atomic Broadcast., , and . CANDAR Workshops, page 195-200. IEEE, (2019)An integrated DFT solution for power reduction in scan test applications by low power gating scan cell., , , , and . Integr., (2017)Test Pattern Ordering and Selection for High Quality Test Set under Constraints., , , and . IEICE Trans. Inf. Syst., 95-D (12): 3001-3009 (2012)A class of sequential circuits with combinational test generation complexity under single-fault assumption., , and . Asian Test Symposium, page 398-403. IEEE Computer Society, (2000)Intra-Die-Variation-Aware Side Channel Analysis for Hardware Trojan Detection., , , , and . ATS, page 52-57. IEEE Computer Society, (2017)Bipartite Full Scan Design: A DFT Method for Asynchronous Circuits., , , and . Asian Test Symposium, page 206-211. IEEE Computer Society, (2010)Parallel Algorithms for All Nearest Neighbors of Binary Images on the BSP Model., , , , and . ISPAN, page 394-399. IEEE Computer Society, (1999)Parallel Selection Algorithms with Analysis on Clusters., , , and . ISPAN, page 388-393. IEEE Computer Society, (1999)Temperature-Variation-Aware Test Pattern Optimization., , , , and . ETS, page 214. IEEE Computer Society, (2011)