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AI Systems Engineering - systematic development and operation of AI-based systems.

J. Beyerer, J. Pfrommer, и T. Usländer. Autom., 70 (9): 753-755 (2022)

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Jürgen Beyerer

J Beyerer

Jürgen Schmidt

Experimentelle und numerische Untersuchung dynamisch belasteter Verbundstrukturen mit zellularen metallischen KernenJ. Schmidt. Uni Erlangen-Nürnberg, (2009)

Jürgen Braun

An application of Kolmogorov's superposition theorem to function reconstruction in higher dimensionsJ. Braun. Uni Bonn, (2009)

Jürgen Meyer

Textvarianz und Schriftkritik: dialogische Schreib- und Lesekultur bei Thomas More, George Gascoigne und John LylyJ. Meyer. Uni Halle-Wittenberg, habilitation, (2009)

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A Phenomenological Approach to Integrating Gaussian Beam Properties and Speckle into a Physically-Based Renderer.S. Bergmann, M. Mohammadikaji, S. Irgenfried, H. Wörn, J. Beyerer, и C. Dachsbacher. VMV, Eurographics Association, (2016)An Evaluation Of Design Choices For Pedestrian Attribute Recognition In Video.A. Specker, A. Schumann, und J. Beyerer. ICIP, Seite 2331-2335. IEEE, (2020)Plug & produce by modelling skills and service-oriented orchestration of reconfigurable manufacturing systems.J. Pfrommer, D. Stogl, K. Aleksandrov, S. Navarro, B. Hein, und J. Beyerer. Automatisierungstechnik, 63 (10): 790-800 (2015)Comprehensive Analysis of Deep Learning-Based Vehicle Detection in Aerial Images.L. Sommer, T. Schuchert, und J. Beyerer. IEEE Trans. Circuits Syst. Video Techn., 29 (9): 2733-2747 (2019)A framework for uncertainty propagation in 3D shape measurement using laser triangulation.M. Mohammadikaji, S. Bergmann, S. Irgenfried, J. Beyerer, C. Dachsbacher, und H. Wörn. I2MTC, Seite 1-6. IEEE, (2016)An ontology for remanufacturing systems.J. Pfrommer, J. Klein, M. Wurster, S. Rapp, P. Grauberger, G. Lanza, A. Albers, S. Matthiesen, und J. Beyerer. Autom., 70 (6): 534-541 (2022)KI-Engineering - AI Systems Engineering.J. Pfrommer, T. Usländer, und J. Beyerer. Autom., 70 (9): 756-766 (2022)Nachruf für Prof. Dr. rer. nat. Hartwig Steusloff.J. Beyerer. Autom., 69 (10): 917-918 (2021)Is it useful to know a nuisance parameter?J. Beyerer. Signal Process., 68 (1): 107-111 (1998)Deflectometry for specular surfaces: an overview.J. Burke, A. Pak, S. Höfer, M. Ziebarth, M. Roschani, und J. Beyerer. CoRR, (2022)