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On the Efficacy of Scan Chain Grouping for Mitigating IR-Drop-Induced Test Data Corruption.

, , , , , и . IEICE Trans. Inf. Syst., 104-D (6): 816-827 (2021)

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Kohei Tatsumi

Kohei Tatsumi

Mohamed Koheil

Susanne Koheil

 

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A novel capture-safety checking method for multi-clock designs and accuracy evaluation with delay capture circuits., , , , , , , и . VTS, стр. 197-202. IEEE Computer Society, (2012)Don't Care Identification and Statistical Encoding for Test Data Compression., , , , и . IEICE Trans. Inf. Syst., 87-D (3): 544-550 (2004)LCTI-SS: Low-Clock-Tree-Impact Scan Segmentation for Avoiding Shift Timing Failures in Scan Testing., , , , , и . IEEE Des. Test, 30 (4): 60-70 (2013)Adaptive ECC Techniques for Reliability and Yield Enhancement of Phase Change Memory., , и . IOLTS, стр. 226-227. IEEE, (2018)On the Efficacy of Scan Chain Grouping for Mitigating IR-Drop-Induced Test Data Corruption., , , , , и . IEICE Trans. Inf. Syst., 104-D (6): 816-827 (2021)On Guaranteeing Capture Safety in At-Speed Scan Testing with Broadcast-Scan-Based Test Compression., , , , , и . VLSI Design, стр. 279-284. IEEE Computer Society, (2013)On Improving Defect Coverage of Stuck-at Fault Tests., , , , и . Asian Test Symposium, стр. 216-223. IEEE Computer Society, (2005)A Method of Static Test Compaction Based on Don't Care Identification., , и . DELTA, стр. 392-395. IEEE Computer Society, (2002)Scan-Out Power Reduction for Logic BIST., , , и . IEICE Trans. Inf. Syst., 96-D (9): 2012-2020 (2013)Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing., , , , , , и . J. Electron. Test., 24 (4): 379-391 (2008)