From post

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

 

Другие публикации лиц с тем же именем

Effect-cause intra-cell diagnosis at transistor level., , , , , , и . ISQED, стр. 460-467. IEEE, (2013)Towards approximation during test of Integrated Circuits., , , , , и . DDECS, стр. 28-33. IEEE, (2017)Synthesis of Finite State Machines on Memristor Crossbars., , , , , и . DDECS, стр. 107-112. IEEE, (2018)Assessing the Reliability of Successive Approximate Computing Algorithms under Fault Injection., , , , и . J. Electron. Test., 35 (3): 367-381 (2019)Cross-layer reliability evaluation, moving from the hardware architecture to the system level: A CLERECO EU project overview., , , , , , , , , и 1 other автор(ы). Microprocess. Microsystems, 39 (8): 1204-1214 (2015)Computing reliability: On the differences between software testing and software fault injection techniques., , , , , и . Microprocess. Microsystems, (2017)Multi-Objective Application-Driven Approximate Design Method., , , и . IEEE Access, (2021)Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks., , , , , , , и . IEEE Trans. Emerg. Top. Comput., 10 (4): 1867-1882 (2022)A Survey on Deep Learning Resilience Assessment Methodologies., , , , , и . Computer, 56 (2): 57-66 (февраля 2023)A dynamic programming algorithm for the single-machine scheduling problem with release dates and deteriorating processing times., и . Math. Methods Oper. Res., 69 (2): 271-280 (2009)