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Guaranteed convergence in a class of Hopfield networks., , and . IEEE Trans. Neural Networks, 3 (6): 951-961 (1992)Random error and burst correction by iterated codes., and . IEEE Trans. Inf. Theory, 18 (1): 182-185 (1972)Random Test Generation With Input Cube Avoidance., and . IEEE Trans. Very Large Scale Integr. Syst., 17 (1): 45-54 (2009)Path Selection for Transition Path Delay Faults., and . IEEE Trans. Very Large Scale Integr. Syst., 18 (3): 401-409 (2010)Resynthesis of combinational logic circuits for improved path delay fault testability using comparison units., and . IEEE Trans. Very Large Scale Integr. Syst., 9 (5): 679-689 (2001)A Repair-for-Diagnosis Methodology for Logic Circuits., , , and . IEEE Trans. Very Large Scale Integr. Syst., 26 (11): 2254-2267 (2018)Embedded Totally Self-Checking Checkers: A Practical Design., and . IEEE Des. Test Comput., 7 (4): 5-12 (1990)Static test compaction for diagnostic test sets of full-scan circuits., and . IET Comput. Digit. Tech., 4 (5): 365-373 (2010)Same/different fault dictionary: an extended pass/fail fault dictionary with improved diagnostic resolution., and . IET Comput. Digit. Tech., 3 (1): 85-93 (2009)Sizes of test sets for path delay faults using strong and weak non-robust tests., and . IET Comput. Digit. Tech., 5 (5): 405-414 (2011)