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A method for diagnosing implementation errors in synchronous sequential circuits and its implications on synthesis., and . EURO-DAC, page 252-258. IEEE Computer Society, (1993)Don't Care Identification and Statistical Encoding for Test Data Compression., , , , and . IEICE Trans. Inf. Syst., 87-D (3): 544-550 (2004)Switching Activity as a Test Compaction Heuristic for Transition Faults., and . IEEE Trans. Very Large Scale Integr. Syst., 18 (9): 1357-1361 (2010)Padding of Multicycle Broadside and Skewed-Load Tests.. IEEE Trans. Very Large Scale Integr. Syst., 27 (11): 2587-2595 (2019)Computing Two-Pattern Test Cubes for Transition Path Delay Faults.. IEEE Trans. Very Large Scale Integr. Syst., 21 (3): 475-485 (2013)A Test Selection Procedure for Improving the Accuracy of Defect Diagnosis.. IEEE Trans. Very Large Scale Integr. Syst., 24 (8): 2759-2767 (2016)Generation of Mixed Test Sets for Transition Faults.. IEEE Trans. Very Large Scale Integr. Syst., 20 (10): 1895-1899 (2012)On Functional Broadside Tests With Functional Propagation Conditions., and . IEEE Trans. Very Large Scale Integr. Syst., 19 (6): 1094-1098 (2011)Selecting Functional Test Sequences for Defect Diagnosis.. IEEE Trans. Very Large Scale Integr. Syst., 26 (10): 2160-2164 (2018)Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations., and . IEEE Trans. Very Large Scale Integr. Syst., 12 (7): 780-788 (2004)