( en | de | ru )

 

Disambiguation

From post

копироватьудалитьдобавить публикацию в буфер
Asymmetric aging of clock networks in power efficient designs.

, , , , и . ISQED, стр. 484-486. IEEE, (2014)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

John M Sullivan

John M MacMahon

Simon M M Laimer

Marcel M M Kuypers

M. Biswas M. Dam

 

Другие публикации лиц с тем же именем

Performance entitlement by exploiting transistor's BTI recovery., , , и . ISQED, стр. 341-346. IEEE, (2013)Pylon: Towards an integrated customizable volume diagnosis infrastructure., , , , , , и . ITC, стр. 1-9. IEEE, (2016)Controlling Aging in Timing-Critical Paths., , , и . IEEE Des. Test, 33 (4): 82-91 (2016)Counterfeit electronics: A rising threat in the semiconductor manufacturing industry., , и . ITC, стр. 1-4. IEEE Computer Society, (2013)Systematic defect detection methodology for volume diagnosis: A data mining perspective., , , , и . ITC, стр. 1-10. IEEE, (2017)A design-for-reliability approach based on grading library cells for aging effects., , , , и . ITC, стр. 1-7. IEEE Computer Society, (2013)Test data analytics - Exploring spatial and test-item correlations in production test data., , , , , , и . ITC, стр. 1-10. IEEE Computer Society, (2013)Asymmetric aging of clock networks in power efficient designs., , , , и . ISQED, стр. 484-486. IEEE, (2014)Special session 11B: ITRS adaptive test update.. VTS, стр. 1. IEEE Computer Society, (2014)Yield Forecasting Across Semiconductor Fabrication Plants and Design Generations., , , , , , , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 36 (12): 2120-2133 (2017)