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A Stimulus-Free Probabilistic Model for Single-Event-Upset Sensitivity.

, , and . VLSI Design, page 100-107. IEEE Computer Society, (2006)

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Techniques for Disturb Fault Collapsing., and . J. Electron. Test., 23 (4): 363-368 (2007)Fault collapsing for flash memory disturb faults., and . ETS, page 142-147. IEEE Computer Society, (2005)A Stimulus-Free Probabilistic Model for Single-Event-Upset Sensitivity., , and . VLSI Design, page 100-107. IEEE Computer Society, (2006)