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Delay-Fault Diagnosis by Critical-Path Tracing.

P. Girard, C. Landrault, and S. Pravossoudovitch. IEEE Des. Test Comput., 9 (4): 27-32 (1992)

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Benoît Girard

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Low-energy BIST design: impact of the LFSR TPG parameters on the weighted switching activity.P. Girard, L. Guiller, C. Landrault, S. Pravossoudovitch, J. Figueras, S. Manich, J. Teixeira, and M. Santos. ISCAS (1), page 110-113. IEEE, (1999)Prioritised ceteris paribus logic for counterfactual reasoning.P. Girard, and M. Triplett. Synthese, 195 (4): 1681-1703 (2018)Example-based programming: a pertinent visual approach for learning to program.N. Guibert, P. Girard, and L. Guittet. AVI, page 358-361. ACM Press, (2004)Nonvolatile Latch Designs With Node-Upset Tolerance and Recovery Using Magnetic Tunnel Junctions and CMOS.A. Yan, L. Wang, J. Cui, Z. Huang, T. Ni, P. Girard, and X. Wen. IEEE Trans. Very Large Scale Integr. Syst., 32 (1): 116-127 (January 2024)DOVA PRO: A Dynamic Overwriting Voltage Adjustment Technique for STT-MRAM L1 Cache Considering Dielectric Breakdown Effect.J. Chen, C. Lu, J. Ni, X. Guo, P. Girard, and Y. Cheng. IEEE Trans. Very Large Scale Integr. Syst., 29 (7): 1325-1334 (2021)Designs of BCD Adder Based on Excess-3 Code in Quantum-Dot Cellular Automata.A. Yan, R. Liu, J. Cui, T. Ni, P. Girard, X. Wen, and J. Zhang. IEEE Trans. Circuits Syst. II Express Briefs, 70 (6): 2256-2260 (June 2023)An Effective Power-Aware At-Speed Test Methodology for IP Qualification and Characterization.K. Juneja, D. Patel, R. Immadi, B. Singh, S. Naudet, P. Agarwal, A. Virazel, and P. Girard. J. Electron. Test., 32 (6): 721-733 (2016)A Scan-BIST Structure to Test Delay Faults in Sequential Circuits.P. Girard, C. Landrault, V. Moreda, S. Pravossoudovitch, and A. Virazel. J. Electron. Test., 14 (1-2): 95-102 (1999)On Using Approximate Computing to Build an Error Detection Scheme for Arithmetic Circuits.B. Deveautour, A. Virazel, P. Girard, and V. Gherman. J. Electron. Test., 36 (1): 33-46 (2020)A Ring Architecture Strategy for BIST Test Pattern Generation.C. Fagot, O. Gascuel, P. Girard, and C. Landrault. J. Electron. Test., 19 (3): 223-231 (2003)

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Disambiguation of "Girard, Patrick"

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Delay-Fault Diagnosis by Critical-Path Tracing.

Please choose a person to relate this publication to

Benoît Girard

Adrien Girard

Pierre Girard

Jules Girard

Yann Girard

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Girard, Patrick"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Delay-Fault Diagnosis by Critical-Path Tracing.

Please choose a person to relate this publication to

Benoît Girard

Adrien Girard

Pierre Girard

Jules Girard

Yann Girard

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
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history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
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Delay-Fault Diagnosis by Critical-Path Tracing.