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Disambiguation of "Ni, Kai"

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A Three-Switch-Based Single-Input Dual-Output Converter With Simultaneous Boost & Buck Voltage Conversion.

, , , , , and . IEEE Trans. Ind. Informatics, 16 (7): 4468-4477 (2020)

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To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Ying Ni

Pedestrian safety at urban signalised intersections. TU Darmstadt, (2009)

Yi Ni

Ji Ni

Xiaoju Ni

Shaoji Ni

 

Other publications of authors with the same name

Electrical and Electronic Technologies in More-Electric Aircraft: A Review., , , , , , and . IEEE Access, (2019)Subgraph-preconditioned conjugate gradients for large scale SLAM., , , , and . IROS, page 2566-2571. IEEE, (2010)Simulation Study of the Effects of Synchronous Generator Parameter Deviations on the Performance of a DFIM-SPS., , , and . IECON, page 5450-5455. IEEE, (2019)Machine Learning Attack Resistant Area-Efficient Reconfigurable Ising-PUF., , and . IEEE Trans. Very Large Scale Integr. Syst., 30 (4): 526-538 (2022)Carbon Nanotube SRAM in 5-nm Technology Node Design, Optimization, and Performance Evaluation - Part I: CNFET Transistor Optimization., , , , , , , , , and 2 other author(s). IEEE Trans. Very Large Scale Integr. Syst., 30 (4): 432-439 (2022)Ground Plane Matters: Picking Up Ground Plane Prior in Monocular 3D Object Detection., , , , , , and . CoRR, (2022)Hybrid Stochastic Synapses Enabled by Scaled Ferroelectric Field-effect Transistors., , , , and . CoRR, (2022)A Reliable and Simple Method for Fabricating a Poly(Dimethylsiloxane) Electrospray Ionization Chip with a Corner-Integrated Emitter., , , , , , and . Sensors, 15 (4): 8931-8944 (2015)The Impact of Ferroelectric FETs on Digital and Analog Circuits and Architectures., , , , , , , , , and 2 other author(s). IEEE Des. Test, 37 (1): 79-99 (2020)Design of 2T/Cell and 3T/Cell Nonvolatile Memories with Emerging Ferroelectric FETs., , , , , , , , , and 1 other author(s). IEEE Des. Test, 36 (3): 39-45 (2019)